Invention Grant
- Patent Title: Apparatus and method for wafer level classification of light emitting device
- Patent Title (中): 发光器件晶圆级别分类的装置和方法
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Application No.: US12769231Application Date: 2010-04-28
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Publication No.: US08476918B2Publication Date: 2013-07-02
- Inventor: Hsin-Chieh Huang
- Applicant: Hsin-Chieh Huang
- Applicant Address: TW Hsinchu
- Assignee: TSMC Solid State Lighting Ltd.
- Current Assignee: TSMC Solid State Lighting Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: G01R31/20
- IPC: G01R31/20
Abstract:
The present disclosure provides a semiconductor test system. The semiconductor test system includes a wafer stage to hold a wafer having a plurality of light emitting devices (LEDs); a probe test card operable to test each test field of the wafer; and a light detector integrated with the probe test card to collect light from a LED of the wafer.
Public/Granted literature
- US20110267087A1 APPARATUS AND METHOD FOR WAFER LEVEL CLASSIFICATION OF LIGHT EMITTING DEVICE Public/Granted day:2011-11-03
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