Invention Grant
- Patent Title: Apparatus for removing reflected light
- Patent Title (中): 用于去除反射光的装置
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Application No.: US12751045Application Date: 2010-03-31
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Publication No.: US08477186B2Publication Date: 2013-07-02
- Inventor: Hirotsugu Eguchi , Mitsuhiko Matsumoto
- Applicant: Hirotsugu Eguchi , Mitsuhiko Matsumoto
- Applicant Address: JP Tokyo
- Assignee: Sumco Corporation
- Current Assignee: Sumco Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2009-091787 20090406
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G01N21/00

Abstract:
An apparatus for removing reflected light is provided, which is used for a measuring device that emits a sheet-like beam of light onto suspended particles and measures light scattered from the suspended particles. The apparatus includes a light introduction unit, a light reflective unit, a light sealing unit and a light absorption member. The light introduction unit has a first aperture, a second aperture, and a passage through which the light travels from the first aperture to the second aperture. The light reflective unit disposed opposite to the second aperture allows the light having traveled through the second aperture to reflect toward a predetermined direction so as to prevent the light from returning into the second aperture. The light sealing unit in which the light reflective unit is disposed has an inner wall to confine the light reflected from the light reflective unit.
Public/Granted literature
- US20100253776A1 APPARATUS FOR REMOVING REFLECTED LIGHT Public/Granted day:2010-10-07
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