Invention Grant
- Patent Title: Polarized, specular reflectometer apparatus
- Patent Title (中): 极化镜面反射仪
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Application No.: US12615183Application Date: 2009-11-09
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Publication No.: US08477308B1Publication Date: 2013-07-02
- Inventor: James Joseph Haycraft
- Applicant: James Joseph Haycraft
- Applicant Address: US DC Washington
- Assignee: The United States of America as Represented by the Secretary of the Navy
- Current Assignee: The United States of America as Represented by the Secretary of the Navy
- Current Assignee Address: US DC Washington
- Agent Charlene A. Haley; Christopher L. Blackburn
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
An apparatus and method for use on precision refractive index experiments that are performed on individual faces of single crystals or liquid surfaces of material using specific wavelengths of light. The process is used to measure the major and minor axes of the optical indicatrix of a single crystal of material at a very specific wavelength. This process is repeated for each crystal face in order to form a complete picture of the refractive index for the sample.
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