Invention Grant
- Patent Title: Position measuring arrangement
- Patent Title (中): 位置测量装置
-
Application No.: US12804735Application Date: 2010-07-28
-
Publication No.: US08477317B2Publication Date: 2013-07-02
- Inventor: Florian Schindler , Robert Kraus , Joel Heersink , Michael Stepputat
- Applicant: Florian Schindler , Robert Kraus , Joel Heersink , Michael Stepputat
- Applicant Address: DE Traunreut
- Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee Address: DE Traunreut
- Agency: Brinks Hofer Gilson & Lione
- Priority: DE102009028068 20090729
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
A position measuring arrangement that includes a retroreflector, a light source generating a lightbeam and a scanning unit that generates a partially-divergent lightbeam. The scanning unit includes a scanning mirror mounted so it is deflected in a reproducible manner so that a grid-like scanning of a two-dimensional spatial area by the partially-divergent lightbeam takes place over a plurality of scanning tracks. The position measuring arrangement including an interferometric distance measuring unit that includes a beam splitter element that splits the lightbeam generated by the light source so that split lightbeams pass through a reference arm and a measuring arm at least once in each direction. The interferometric distance measuring unit includes an opto-electronic detector unit, through which a detection of distance-dependent signals from superimposed lightbeams from the reference arm and the measuring arm takes place.
Public/Granted literature
- US20110026041A1 Position measuring arrangement Public/Granted day:2011-02-03
Information query