Invention Grant
- Patent Title: Semiconductor device equipped with a plurality of memory banks and test method of the semiconductor device
- Patent Title (中): 配备有多个存储体的半导体装置和半导体装置的试验方法
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Application No.: US13172252Application Date: 2011-06-29
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Publication No.: US08477548B2Publication Date: 2013-07-02
- Inventor: Kenji Mae
- Applicant: Kenji Mae
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-148935 20100630
- Main IPC: G11C7/00
- IPC: G11C7/00
Abstract:
A write circuit writes a first data signal that is an input data signal that indicates a first logic level to each memory bank in sequence and writes a second data signal that is an input data signal that indicates a second logic level to each memory bank simultaneously.
Public/Granted literature
Information query
