Invention Grant
- Patent Title: Method of measuring geometric variables of a structure contained in an image
- Patent Title (中): 测量图像中包含的结构的几何变量的方法
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Application No.: US10488433Application Date: 2002-09-03
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Publication No.: US08478023B2Publication Date: 2013-07-02
- Inventor: Michael Kaus , Juergen Weese , Steven Lobregt
- Applicant: Michael Kaus , Juergen Weese , Steven Lobregt
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: DE10144004 20010907
- International Application: PCT/IB02/03632 WO 20020903
- International Announcement: WO03/023717 WO 20030320
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
The invention relates to a method of measuring geometric variables of a three-dimensional structure contained in an object from at least on image representing the object, having the following steps:—use of a deformable first model describing the structure, the shape of which model can be described by parameters,—adjustment of the first model to the structure in the image,—determination of the parameters at which the first model exhibits optimum conformity with the structure,—use of a deformable second model describing the structure, which second model in shape corresponds to the first model, and which in addition contains at least one geometric variable,—modification of the second model according to the parameters determined, and—derivation of the geometric variable(s) from the modified second model.
Public/Granted literature
- US20050002556A1 Method of measuring geometric variables of a structure contained in an image Public/Granted day:2005-01-06
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