Invention Grant
- Patent Title: Microscope system and method
- Patent Title (中): 显微镜系统及方法
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Application No.: US13333527Application Date: 2011-12-21
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Publication No.: US08478073B2Publication Date: 2013-07-02
- Inventor: John R. Maddison
- Applicant: John R. Maddison
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: GB0302664.8 20030205
- Main IPC: G06K9/46
- IPC: G06K9/46 ; G06K9/00

Abstract:
A method for determining a position of an area of an object within the complete object, wherein the image of the area of the object is contained within a field of view of a microscope. The method comprises acquiring high magnification image data representing an image of the field of view of the microscope, typically from a digital camera attached to the microscope; processing the high magnification image data to reduce the resolution thereof; comparing the processed high magnification image data with portions of the low magnification image data, and determining said position based on the results of said comparison.
Public/Granted literature
- US20120120225A1 MICROSCOPE SYSTEM AND METHOD Public/Granted day:2012-05-17
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