Invention Grant
- Patent Title: Method of measuring electrical resistance value of corneal trans-epithelium
- Patent Title (中): 测量角膜上皮细胞电阻值的方法
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Application No.: US12921069Application Date: 2009-03-03
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Publication No.: US08478395B2Publication Date: 2013-07-02
- Inventor: Masafumi Uematsu , Takashi Kitaoka , Koji Nishida , Yuji Tanaka , Matsuhiko Nishizawa , Hirokazu Kaji , Soichiro Sekine
- Applicant: Masafumi Uematsu , Takashi Kitaoka , Koji Nishida , Yuji Tanaka , Matsuhiko Nishizawa , Hirokazu Kaji , Soichiro Sekine
- Applicant Address: JP Nagasaki-shi JP Sendai-shi
- Assignee: Nagasaki University,Tohoku University
- Current Assignee: Nagasaki University,Tohoku University
- Current Assignee Address: JP Nagasaki-shi JP Sendai-shi
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: JP2008-052567 20080303
- International Application: PCT/JP2009/053968 WO 20090303
- International Announcement: WO2009/110470 WO 20090911
- Main IPC: A61B5/053
- IPC: A61B5/053
Abstract:
The invention provides a method for evaluating a corneal disorder quantitatively and is applicable to living eyes. In particular, the invention provides a method for measuring a corneal transepithelial electric resistance, which method comprises: (1) a step of placing a first electrode on the cornea and a second electrode on the conjunctiva; and (2) a step of flowing an electric current between the first electrode and the second electrode to measure the electric resistance. The invention also provides a device for measuring a corneal transepithelial electric resistance value.
Public/Granted literature
- US20110046509A1 METHOD OF MEASURING ELECTRICAL RESISTANCE VALUE OF CORNEAL TRANS-EPITHELIUM Public/Granted day:2011-02-24
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