Invention Grant
US08478534B2 Method for detecting discriminatory data patterns in multiple sets of data and diagnosing disease
失效
用于检测多组数据中的歧视性数据模式并诊断疾病的方法
- Patent Title: Method for detecting discriminatory data patterns in multiple sets of data and diagnosing disease
- Patent Title (中): 用于检测多组数据中的歧视性数据模式并诊断疾病的方法
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Application No.: US10868387Application Date: 2004-06-14
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Publication No.: US08478534B2Publication Date: 2013-07-02
- Inventor: Wei Zhu , Xuena Wang , John S. Kovach
- Applicant: Wei Zhu , Xuena Wang , John S. Kovach
- Applicant Address: US NY Albany
- Assignee: The Research Foundation For The State University of New York
- Current Assignee: The Research Foundation For The State University of New York
- Current Assignee Address: US NY Albany
- Agency: The Farrell Law Firm, P.C.
- Main IPC: G01N33/50
- IPC: G01N33/50

Abstract:
A comprehensive analysis procedure for analyzing and comparing multiple sets of data to detect hidden discriminatory data patterns. The inventive procedure identifies a best subset of markers for optimal discrimination between two or more sets of data. A point-wise test on two or more sets of data is performed to calculate test statistic values and to generate a statgram, a two- or higher- dimensional map of the test statistic values along the range of data. A threshold is then determined for isolating critical regions of the statgram at each significance level to provide candidate markers. A subset of markers from the candidate markers is then selected to discriminate among the sets of data. The two or more sets of data are classified using the subset of markers.
Public/Granted literature
- US20050022168A1 Method and system for detecting discriminatory data patterns in multiple sets of data Public/Granted day:2005-01-27
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