Invention Grant
- Patent Title: Method for measuring physical property values of a cell
- Patent Title (中): 测量细胞物理性质值的方法
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Application No.: US12733031Application Date: 2008-07-28
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Publication No.: US08478546B2Publication Date: 2013-07-02
- Inventor: Yoichi Katsumoto , Yoshihito Hayashi
- Applicant: Yoichi Katsumoto , Yoshihito Hayashi
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: JP2007-209108 20070810
- International Application: PCT/JP2008/063500 WO 20080728
- International Announcement: WO2009/022536 WO 20090219
- Main IPC: G01N33/48
- IPC: G01N33/48
Abstract:
The present invention relates to a method for measuring physical property values of a cell based on dielectric spectroscopy and based on modeling electrical characteristics such as electric conductivity, electric permittivity, dielectric constant change, and dielectric relaxation expressions in order to obtain membrane capacitance and cytoplasmic conductivity values of the cell.
Public/Granted literature
- US20100136606A1 METHOD OF MEASURING PHYSICAL PROPERTY VALUES OF CELL AND PHYSICAL PROPERTY MEASURING APPARATUS Public/Granted day:2010-06-03
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