Invention Grant
- Patent Title: Measuring node proximity on graphs with side information
- Patent Title (中): 测量具有侧面信息的图形上的节点接近度
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Application No.: US12638531Application Date: 2009-12-15
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Publication No.: US08478785B2Publication Date: 2013-07-02
- Inventor: Hani T. Jamjoom , Huiming Qu , Hanghang Tong
- Applicant: Hani T. Jamjoom , Huiming Qu , Hanghang Tong
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Daniel P. Morris, Esq.
- Main IPC: G06F17/30
- IPC: G06F17/30

Abstract:
In a computerized data mining context, user input relating to positive and negative information is incorporated into node proximity measurements on a weighted, directed graph. Starting from a source node, links are added to nodes for which positive feedback is received. Where negative information is received, a sink node is substituted for nodes receiving negative information. Nodes neighboring that sink node have links added to the sink. These changes yield an altered graph. Afterwards, proximity information is determined from the altered graph.
Public/Granted literature
- US20110145262A1 MEASURING NODE PROXIMITY ON GRAPHS WITH SIDE INFORMATION Public/Granted day:2011-06-16
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