Invention Grant
- Patent Title: Method for determining sampling rate and device therefor
- Patent Title (中): 确定采样率的方法及其设备
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Application No.: US12822196Application Date: 2010-06-24
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Publication No.: US08478806B2Publication Date: 2013-07-02
- Inventor: Chi-Hung Wu
- Applicant: Chi-Hung Wu
- Applicant Address: TW Hsinchu
- Assignee: Sunplus Technology Co., Ltd.
- Current Assignee: Sunplus Technology Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW99115785A 20100518
- Main IPC: G06F17/10
- IPC: G06F17/10

Abstract:
A method and a device for determining sampling rate are provided. The device receives an input signal of SPDIF. The method includes following steps. A plurality of multiple values between a plurality of bi-phase clock frequencies of the input signal and a system frequency are obtained, and a first weighted average and a second weighted average are calculated according to a first filter range, a second filter range and the multiple values. When a first difference is greater than a second difference, the sampling rate is set to a first sampling rate. Otherwise, the sampling rate is set to a second sampling rate. The first difference and the second difference are obtained according to the first weighted average, the second weighted average and a frequency threshold. The method determines the sampling rate rapidly according to weighted averages adjusted by filter ranges, reduces a probability of erroneous judgment and saves memory.
Public/Granted literature
- US20110289129A1 METHOD FOR DETERMINING SAMPLING RATE AND DEVICE THEREFOR Public/Granted day:2011-11-24
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