Invention Grant
- Patent Title: Memory with self-test function and method for testing the same
- Patent Title (中): 内存具有自检功能和测试方法
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Application No.: US13007691Application Date: 2011-01-17
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Publication No.: US08479060B2Publication Date: 2013-07-02
- Inventor: Shuo-Fen Kuo , Jih-Nung Lee , Sung-Kuang Wu
- Applicant: Shuo-Fen Kuo , Jih-Nung Lee , Sung-Kuang Wu
- Applicant Address: TW Hsinchu
- Assignee: Realtek Semiconductor Corp.
- Current Assignee: Realtek Semiconductor Corp.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Priority: TW99101195A 20100118
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
The present invention relates to a memory with a self-test function and a method for testing the same. The memory comprises a testing unit, a memory unit, and a comparison module. The method for testing the memory comprises steps of the testing unit producing a pattern signal; a first storage block of the memory unit storing storage data, and outputting the storage data according to the pattern signal; a second storage block of the memory storing a compare signature corresponding to the storage data; and the compare module producing a test signature according to the storage data output by the memory unit, and comparing the test signature to the compare signature and outputting a testing result for judging validity of the memory unit. Thereby, the memory unit according to the present invention is partitioned into two storage blocks for storing the storage data and the compare signature, respectively, and thus achieving the purposes of saving the testing time, costs, and hardware resources.
Public/Granted literature
- US20110179323A1 Memory with Self-Test Function and Method for Testing the Same Public/Granted day:2011-07-21
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