Invention Grant
- Patent Title: Air-micrometer calibration device
- Patent Title (中): 气密千分尺校准装置
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Application No.: US12863606Application Date: 2009-01-16
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Publication No.: US08479564B2Publication Date: 2013-07-09
- Inventor: Noritaka Fujimura
- Applicant: Noritaka Fujimura
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Heavy Industries, Ltd.
- Current Assignee: Mitsubishi Heavy Industries, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2008-010174 20080121
- International Application: PCT/JP2009/050506 WO 20090116
- International Announcement: WO2009/093521 WO 20090730
- Main IPC: G01M3/02
- IPC: G01M3/02

Abstract:
The present invention aims to provide an air-micrometer calibration device capable of securely causing an axis of a measuring-head tip portion and an axis of a master hole to coincide with each other. To this end, the air-micrometer calibration device (91) includes a small-diameter master hole (95); a large-diameter master hole (96); and positioning means for causing an axis of the measuring-head tip portion and an axis of the small-diameter master hole to coincide with each other when a measuring-head tip portion (43) is inserted in the small-diameter master hole (95), and for causing the axis of the measuring-head tip portion and an axis of the large-diameter master hole to coincide with each other when the measuring-head tip portion is inserted in the large-diameter master hole, where the positioning means includes: a pressure oil supply passage (98); a clamping sleeve (93); and a hydraulic pressure chamber (97) surrounding a periphery of the clamping sleeve, and the clamping sleeve clamps a measuring-head body portion (42) (a case (46)) in association with a pressure of a pressure oil supplied from the pressure oil supply passage to the hydraulic pressure chamber.
Public/Granted literature
- US20110000274A1 AIR-MICROMETER CALIBRATION DEVICE Public/Granted day:2011-01-06
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