Invention Grant
- Patent Title: Plasma processing apparatus
- Patent Title (中): 等离子体处理装置
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Application No.: US12095262Application Date: 2006-11-15
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Publication No.: US08480848B2Publication Date: 2013-07-09
- Inventor: Caizhong Tian , Tetsuya Nishizuka , Toshihisa Nozawa
- Applicant: Caizhong Tian , Tetsuya Nishizuka , Toshihisa Nozawa
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2005-344643 20051129
- International Application: PCT/JP2006/322750 WO 20061115
- International Announcement: WO2007/063708 WO 20070607
- Main IPC: C23C16/00
- IPC: C23C16/00 ; C23F1/00 ; H01L21/306

Abstract:
The present invention relates to a plasma processing apparatus including: a processing chamber whose ceiling portion is opened and the inside thereof can be evacuated to vacuum; a ceiling plate which is made of dielectric material and is airtightly mounted to an opening of the ceiling portion; a planar antenna member which is installed on a top surface of the ceiling plate, for introducing a microwave into the processing chamber; and a coaxial waveguide, which has a central conductor connected to the planar antenna member, for supplying the microwave, wherein a gas passage is formed to pass through the central conductor, the planar antenna member, and the ceiling plate, and an electric field attenuating recess for attenuating an electric field intensity of the center portion of the ceiling plate is installed on a top surface of a center area of the ceiling plate.
Public/Granted literature
- US20090242130A1 PLASMA PROCESSING APPARATUS Public/Granted day:2009-10-01
Information query
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