Invention Grant
- Patent Title: Semiconductor element comprising a low variation substrate diode
- Patent Title (中): 半导体元件包括低变化衬底二极管
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Application No.: US12914123Application Date: 2010-10-28
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Publication No.: US08481374B2Publication Date: 2013-07-09
- Inventor: Thilo Scheiper
- Applicant: Thilo Scheiper
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Williams, Morgan & Amerson, P.C.
- Priority: DE102010001405 20100129
- Main IPC: H01L21/70
- IPC: H01L21/70 ; H01L21/00

Abstract:
A substrate diode of an SOI device may be formed on the basis of contact regions in an early manufacturing stage, i.e., prior to patterning gate electrode structures of transistors, thereby imparting superior stability to the sensitive diode regions, such as the PN junction. In some illustrative embodiments, only one additional deposition step may be required compared to conventional strategies, thereby providing a very efficient overall process flow.
Public/Granted literature
- US20110186957A1 SEMICONDUCTOR ELEMENT COMPRISING A LOW VARIATION SUBSTRATE DIODE Public/Granted day:2011-08-04
Information query
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