Invention Grant
- Patent Title: Apparatus and method for elemental analysis of particles by mass spectrometry
- Patent Title (中): 通过质谱法对颗粒元素分析的装置和方法
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Application No.: US13168596Application Date: 2011-06-24
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Publication No.: US08481925B2Publication Date: 2013-07-09
- Inventor: Alexei Antonov , Dmitry Roman Bandura
- Applicant: Alexei Antonov , Dmitry Roman Bandura
- Applicant Address: CA Markham
- Assignee: DVS Sciences Inc.
- Current Assignee: DVS Sciences Inc.
- Current Assignee Address: CA Markham
- Agency: Senniger Powers LLP
- Main IPC: H01J49/26
- IPC: H01J49/26

Abstract:
An apparatus for elemental analysis of particles such as single cells or single beads by mass spectrometry is described. The apparatus includes means for particle introduction; means to vaporize, atomize and ionize elements associated with a particle; means to separate the ions according to their mass-to-charge ratio; means to detect the separated ions, means to digitize the output of the means to detect the ions; means to transfer and/or to process and/or record the data output of the means to digitize, having means to detect the presence of a particle in a mass spectrometer; and means to synchronize one of the means for ion detection, data digitization, transfer, processing and recording with the means to detect the presence of a particle. Methods and computer readable code implementing aspects of the apparatus, and for reducing the rates of data generation, digitization, transfer, processing and recording are also described.
Public/Granted literature
- US20120061561A1 APPARATUS AND METHOD FOR ELEMENTAL ANALYSIS OF PARTICLES BY MASS SPECTROMETRY Public/Granted day:2012-03-15
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