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US08481932B2 Charged particle beam analyzer and analysis method 有权
带电粒子束分析仪及分析方法

Charged particle beam analyzer and analysis method
Abstract:
In a charged particle beam analyzer irradiating a charged particle beam to a sample in a vacuum container and detecting an X-ray generated from the sample to analyze the sample, two or more X-ray lenses configured in different manners are provided in the vacuum container. This no longer requires air opening in the vacuum container following X-ray lens replacement and also no longer requires vacuuming, making it possible to perform analysis with high efficiency and high sensitivity.
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