Invention Grant
- Patent Title: Charged particle beam analyzer and analysis method
- Patent Title (中): 带电粒子束分析仪及分析方法
-
Application No.: US13433362Application Date: 2012-03-29
-
Publication No.: US08481932B2Publication Date: 2013-07-09
- Inventor: Yoshihiro Anan , Masanari Koguchi
- Applicant: Yoshihiro Anan , Masanari Koguchi
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2011-086286 20110408
- Main IPC: H01J37/26
- IPC: H01J37/26

Abstract:
In a charged particle beam analyzer irradiating a charged particle beam to a sample in a vacuum container and detecting an X-ray generated from the sample to analyze the sample, two or more X-ray lenses configured in different manners are provided in the vacuum container. This no longer requires air opening in the vacuum container following X-ray lens replacement and also no longer requires vacuuming, making it possible to perform analysis with high efficiency and high sensitivity.
Public/Granted literature
- US20120257720A1 CHARGED PARTICLE BEAM ANALYZER AND ANALYSIS METHOD Public/Granted day:2012-10-11
Information query