Invention Grant
- Patent Title: Particulate matter detection device and inspection method of the particulate matter detection device
- Patent Title (中): 颗粒物检测装置的颗粒物检测装置及检查方法
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Application No.: US12979455Application Date: 2010-12-28
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Publication No.: US08482288B2Publication Date: 2013-07-09
- Inventor: Shoji Yokoi , Takayuki Sakurai , Tatsuya Okayama , Masanobu Miki , Keizo Iwama , Makoto Hattori , Hidetaka Ozawa
- Applicant: Shoji Yokoi , Takayuki Sakurai , Tatsuya Okayama , Masanobu Miki , Keizo Iwama , Makoto Hattori , Hidetaka Ozawa
- Applicant Address: JP Nagoya JP Minato-Ku
- Assignee: NGK Insulators, Ltd.,Honda Motor Co., Ltd.
- Current Assignee: NGK Insulators, Ltd.,Honda Motor Co., Ltd.
- Current Assignee Address: JP Nagoya JP Minato-Ku
- Agency: Burr & Brown
- Priority: JP2010-002300 20100107
- Main IPC: F02P17/00
- IPC: F02P17/00

Abstract:
The particulate matter detection device of the present invention is a particulate matter detection device 100 including an electrode portion 21 and detection means 23 for detecting an electrical characteristic of the electrode portion 21, whereby a particulate matter 36 contained in an exhaust gas 32 is detected on the basis of a change of the electrical characteristic due to the particulate matter 36 attached to the electrode portion 21. The particulate matter detection device i00 further includes removal means 25 and abnormality judgment means 26 for comparing an initial electrical characteristic in a use initial state of the device with the electrical characteristic measured in a state where the particulate matter 36 attached to the surface of the electrode portion 21 is removed by the removal means 25, to judge whether or not the particulate matter detection device i00 has an abnormality.
Public/Granted literature
- US20110163761A1 PARTICULATE MATTER DETECTION DEVICE AND INSPECTION METHOD OF THE PARTICULATE MATTER DETECTION DEVICE Public/Granted day:2011-07-07
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