Invention Grant
US08482442B2 System and methods to improve the performance of semiconductor based sampling system 有权
提高半导体采样系统性能的系统和方法

System and methods to improve the performance of semiconductor based sampling system
Abstract:
Circuits and methods that improve the performance of electronic sampling systems are provided. Impedances associated with sampling semiconductor switches are maintained substantially constant during sample states, at least in part, by compensating for encountered input signal variations in order to reduce or minimize signal distortion associated with sampled signals that pass through the sampling switch.
Information query
Patent Agency Ranking
0/0