Invention Grant
- Patent Title: System and methods to improve the performance of semiconductor based sampling system
- Patent Title (中): 提高半导体采样系统性能的系统和方法
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Application No.: US13155922Application Date: 2011-06-08
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Publication No.: US08482442B2Publication Date: 2013-07-09
- Inventor: David M. Thomas
- Applicant: David M. Thomas
- Applicant Address: US CA Milpitas
- Assignee: Linear Technology Corporation
- Current Assignee: Linear Technology Corporation
- Current Assignee Address: US CA Milpitas
- Agency: McDermott Will & Emery LLP
- Main IPC: H03M1/00
- IPC: H03M1/00

Abstract:
Circuits and methods that improve the performance of electronic sampling systems are provided. Impedances associated with sampling semiconductor switches are maintained substantially constant during sample states, at least in part, by compensating for encountered input signal variations in order to reduce or minimize signal distortion associated with sampled signals that pass through the sampling switch.
Public/Granted literature
- US20120313800A1 SYSTEM AND METHODS TO IMPROVE THE PERFORMANCE OF SEMICONDUCTOR BASED SAMPLING SYSTEM Public/Granted day:2012-12-13
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