Invention Grant
- Patent Title: Exposure apparatus, exposure method, and method for producing device
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Application No.: US11597745Application Date: 2005-06-09
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Publication No.: US08482716B2Publication Date: 2013-07-09
- Inventor: Hiroyuki Nagasaka , Takeshi Okuyama
- Applicant: Hiroyuki Nagasaka , Takeshi Okuyama
- Applicant Address: JP Tokyo JP Yokohama
- Assignee: Nikon Corporation,Nikon Engineering Co., Ltd.
- Current Assignee: Nikon Corporation,Nikon Engineering Co., Ltd.
- Current Assignee Address: JP Tokyo JP Yokohama
- Agency: Oliff & Berridge, PLC
- Priority: JP2004-172569 20040610; JP2004-245260 20040825; JP2004-330582 20041115
- International Application: PCT/JP2005/010576 WO 20050609
- International Announcement: WO2005/122221 WO 20051222
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/52

Abstract:
Exposure apparatus exposes a substrate by irradiating the substrate with exposure light via a projection optical system and a liquid. The exposure apparatus is provided with a liquid immersion mechanism for supplying the liquid and recovering the liquid. The liquid immersion mechanism has an inclined surface, which is opposite to a surface of the substrate and is inclined with respect to the surface of the substrate, and a liquid recovering port of the liquid immersion mechanism is formed in the inclined surface. A flat portion is provided between the substrate and the projection optical system. A liquid immersion area can be maintained to be small.
Public/Granted literature
- US20080266533A1 Exposure Apparatus, Exposure Method, and Method for Producing Device Public/Granted day:2008-10-30
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