Invention Grant
- Patent Title: Optical information analyzer and optical information analysis method
- Patent Title (中): 光信息分析仪和光信息分析方法
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Application No.: US13337848Application Date: 2011-12-27
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Publication No.: US08482723B2Publication Date: 2013-07-09
- Inventor: Ken Tsukii , Kenichi Kimura , Toru Takahashi , Jie Xu
- Applicant: Ken Tsukii , Kenichi Kimura , Toru Takahashi , Jie Xu
- Applicant Address: JP Tokyo
- Assignee: Furukawa Electric Co., Ltd.
- Current Assignee: Furukawa Electric Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An optical information analyzer (10) includes a light emitting unit (30) that emits light (excitation light) (L0) to a sample (S), a transmission light receiving unit (50) that receives transmission light (L1), which is the excitation light passing through the sample (S), and detects the received transmission light as a transmission light signal (SG1), scattered light/fluorescence receiving units (60) and (70) that are provided at a plurality of positions, receive side scattered light/fluorescence components (L2) and (L3) from the sample (S), and detect the received side scattered light/fluorescence components as scattered light/fluorescence signals (SG2) and (SG3), and an analyzing unit (90) that measures the optical information of the sample (S) on the basis of the detected scattered light/fluorescence signals (SG2) and (SG3) and the detected transmission light signal (SG1) and analyzes the sample (S) on the basis of the measured optical information.
Public/Granted literature
- US20120154804A1 OPTICAL INFORMATION ANALYZER AND OPTICAL INFORMATION ANALYSIS METHOD Public/Granted day:2012-06-21
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