Invention Grant
- Patent Title: Microparticle measuring apparatus
- Patent Title (中): 微粒测量仪
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Application No.: US12792859Application Date: 2010-06-03
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Publication No.: US08482731B2Publication Date: 2013-07-09
- Inventor: Yosuke Muraki
- Applicant: Yosuke Muraki
- Applicant Address: JP Tokyo
- Assignee: Felica Networks, Inc.
- Current Assignee: Felica Networks, Inc.
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JPP2009-138789 20090610
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A microparticle measuring apparatus which includes a flow channel through which a solution containing microparticles flows, an optical detecting unit configured to direct a laser beam to microparticles passing through the flow channel and detecting light for measurement emanating from the microparticles and converting the thus detected light into electrical signals, a solution feeding unit configured to feed the flow channel with either a sample solution containing microparticles of interest or a calibration solution containing reference microparticles that exhibit uniform optical characteristics, and an optical axis correcting unit configured to optimize the relative position of the flow channel with respect to the laser beam in response to the intensity of electrical signals from the reference microparticles.
Public/Granted literature
- US20100315639A1 MICROPARTICLE MEASURING APPARATUS Public/Granted day:2010-12-16
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