Invention Grant
- Patent Title: Temperature control within disk drive testing systems
- Patent Title (中): 磁盘驱动器测试系统内的温度控制
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Application No.: US12856056Application Date: 2010-08-13
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Publication No.: US08482915B2Publication Date: 2013-07-09
- Inventor: Brian S. Merrow
- Applicant: Brian S. Merrow
- Applicant Address: US MA North Reading
- Assignee: Teradyne, Inc.
- Current Assignee: Teradyne, Inc.
- Current Assignee Address: US MA North Reading
- Agency: Fish & Richardson P.C.
- Main IPC: H05K7/20
- IPC: H05K7/20

Abstract:
A disk drive test slot thermal control system includes a test slot. The test slot includes a housing and an air mover (e.g., a blower or a fan). The housing includes an outer surface, and an internal cavity. The internal cavity includes a test compartment for receiving a disk drive for testing. The housing also includes an inlet aperture extending from the outer surface of the housing to the internal cavity. The air mover can be disposed outside of the internal cavity to provide an air flow towards the test compartment through the inlet aperture.
Public/Granted literature
- US20100302678A1 Temperature Control Within Disk Drive Testing Systems Public/Granted day:2010-12-02
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