Invention Grant
- Patent Title: Internal signal generator for use in semiconductor memory device
- Patent Title (中): 用于半导体存储器件的内部信号发生器
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Application No.: US11477540Application Date: 2006-06-30
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Publication No.: US08483005B2Publication Date: 2013-07-09
- Inventor: Beom-Ju Shin
- Applicant: Beom-Ju Shin
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2005-0090891 20050929; KR10-2005-0134002 20051229
- Main IPC: G11C8/18
- IPC: G11C8/18 ; G11C8/04

Abstract:
A semiconductor memory device includes a pipe latch unit having a plurality of pipe latches, each of which latches an external address in response to the activation of an external command and outputs an internal address in response to the activation of an internal command corresponding to the external command. A pipe latch control unit is configured to control the pipe latch unit to sequentially enable the plurality of pipe latches. An output drive unit is configured to selectively output the internal address or the external address. The internal command is activated after a predetermined latency from an activation timing of the external command.
Public/Granted literature
- US20070070677A1 Internal signal generator for use in semiconductor memory device Public/Granted day:2007-03-29
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