Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US12569806Application Date: 2009-09-29
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Publication No.: US08483073B2Publication Date: 2013-07-09
- Inventor: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G01R31/08
- IPC: G01R31/08

Abstract:
There is provided a test apparatus for testing a device under test, including a receiving section that receives a packet from the device under test, a packet data sequence storing section that stores a data sequence included in each type of packet and received data included in the packet received by the receiving section, a transmission data processing section that reads data from the packet data sequence storing section and generates a test data sequence by adjusting a predetermined portion of a data sequence of a packet to be transmitted to the device under test to have a value corresponding to the received data, and a transmitting section that transmits the test data sequence generated by the transmission data processing section to the device under test.
Public/Granted literature
- US20100142393A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2010-06-10
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