Invention Grant
- Patent Title: Measurement apparatus, measurement method, and feature identification apparatus
- Patent Title (中): 测量装置,测量方法和特征识别装置
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Application No.: US12527478Application Date: 2008-02-15
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Publication No.: US08483442B2Publication Date: 2013-07-09
- Inventor: Junichi Takiguchi , Naoyuki Kajiwara , Yoshihiro Shima , Ryujiro Kurosaki , Takumi Hashizume
- Applicant: Junichi Takiguchi , Naoyuki Kajiwara , Yoshihiro Shima , Ryujiro Kurosaki , Takumi Hashizume
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Mitsubishi Electric Corporation,Waseda University
- Current Assignee: Mitsubishi Electric Corporation,Waseda University
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-035918 20070216
- International Application: PCT/JP2008/052509 WO 20080215
- International Announcement: WO2008/099915 WO 20080821
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
It is an object to measure a position of a feature around a road. An image memory unit stores images in which neighborhood of the road is captured. Further, a three-dimensional point cloud model memory unit 709 stores a point cloud showing three-dimensional coordinates obtained by laser measurement which is carried out simultaneously to the image-capturing of the images as a road surface shape model. A model projecting unit 172 projects a point cloud on the image, and an image displaying unit 341 displays the point cloud superimposed with the image on the displaying device. Using an image point inputting unit 342, a pixel on a feature of a measurement target is specified by a user as a measurement image point. A neighborhood extracting unit 171 extracts a point which is located adjacent to the measurement image point and superimposed on the feature for the measurement target from the point cloud. A feature position calculating unit 174 outputs three-dimensional coordinates shown by the extracted point as three-dimensional coordinates of the feature for the measurement target.
Public/Granted literature
- US20100034426A1 MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND FEATURE IDENTIFICATION APPARATUS Public/Granted day:2010-02-11
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