Invention Grant
US08483465B2 X-ray image processing method and X-ray image processing system using open curve fourier descriptors 失效
X射线图像处理方法和X射线图像处理系统采用开放曲线傅立叶描述符

  • Patent Title: X-ray image processing method and X-ray image processing system using open curve fourier descriptors
  • Patent Title (中): X射线图像处理方法和X射线图像处理系统采用开放曲线傅立叶描述符
  • Application No.: US12936521
    Application Date: 2009-04-07
  • Publication No.: US08483465B2
    Publication Date: 2013-07-09
  • Inventor: Koji Mori
  • Applicant: Koji Mori
  • Applicant Address: JP Yamaguchi
  • Assignee: Yamaguchi University
  • Current Assignee: Yamaguchi University
  • Current Assignee Address: JP Yamaguchi
  • Agency: Rabin & Berdo, P.C.
  • Priority: JP2008-100173 20080408
  • International Application: PCT/JP2009/057100 WO 20090407
  • International Announcement: WO2009/125755 WO 20091015
  • Main IPC: G06K9/00
  • IPC: G06K9/00
X-ray image processing method and X-ray image processing system using open curve fourier descriptors
Abstract:
3D position and attitude can be estimated in a short calculation time based on 2D projection image of an object such as an artificial joint bone or a living tissue bone when a part of the contour of the object in the 2D projection image cannot be discriminated due to a deficient part of the contour or noise. An X-ray image processing method of estimating position and attitude of a measuring object by comparing the measuring object on an X-ray projection image with a parent database storing data of a plurality of candidate objects is provided. The 3D shape of the candidate object is known, and the parent database stores an element-contour group of a plurality of candidate objects projected on 2D plane from various angles. An element-contour corresponding to the contour of said measuring object and a candidate object corresponding to the measuring object are estimated by comparing coefficient of open curve Fourier descriptors of contour of the measuring object with coefficient of open curve Fourier descriptors of each element-contour of the element-contour group, and position and attitude of the measuring object are calculated based on the element-contour corresponding to the contour of the measuring object and the candidate object corresponding to the measuring object.
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