Invention Grant
- Patent Title: Method of laser vibration defect analysis
- Patent Title (中): 激光振动缺陷分析方法
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Application No.: US12794065Application Date: 2010-06-04
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Publication No.: US08483977B1Publication Date: 2013-07-09
- Inventor: Nathan Johnnie , Lynn T. Antonelli , Francis J. O'Brien, Jr.
- Applicant: Nathan Johnnie , Lynn T. Antonelli , Francis J. O'Brien, Jr.
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Secretary of the Navy
- Current Assignee: The United States of America as represented by the Secretary of the Navy
- Current Assignee Address: US DC Washington
- Agent James M. Kasischke; Michael P. Stanley; Jean-Paul A. Nasser
- Main IPC: G01B5/28
- IPC: G01B5/28
Abstract:
A method for locating defects in a target includes subjecting the target to an ultrasonic vibration. A first laser beam is then transmitted to the target and a reflection is received. A vibration signal is produced from the reflection that gives the target's response to the ultrasonic vibration. A digital image is produced of the target that includes the region of the first laser beam reflection. The digital images are overlaid with the vibration signal to provide overlaid data. The overlaid data is tested to determine a probability of the overlaid data being non-random. The probability is compared against a threshold to indicate a potential area of concern that may include defects.
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