Invention Grant
- Patent Title: Signal test apparatus and method
- Patent Title (中): 信号测试装置及方法
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Application No.: US12854910Application Date: 2010-08-12
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Publication No.: US08484513B2Publication Date: 2013-07-09
- Inventor: Huang-Ching Lu
- Applicant: Huang-Ching Lu
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: TW99112543A 20100421
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A system and method for restoring a signal test apparatus to a previous state receives a time interval set by a user to create restore point files. The signal test apparatus tests signals of a test object and creates a restore point file according to the time interval. The restore point file stores signal test data of a test object when the restore point file is created. If the signal test apparatus needs to be restored to a previous state, the signal test data of a latest restore point file are acquired. The acquired signal test data are displayed on a display of the signal test apparatus.
Public/Granted literature
- US20110264955A1 SIGNAL TEST APPARATUS AND METHOD Public/Granted day:2011-10-27
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