Invention Grant
- Patent Title: Microprobe, measurement system and method
- Patent Title (中): 微探针,测量系统及方法
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Application No.: US12742813Application Date: 2008-11-17
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Publication No.: US08484755B2Publication Date: 2013-07-09
- Inventor: Richard Leach , Ben Hughes , Alan Wilson
- Applicant: Richard Leach , Ben Hughes , Alan Wilson
- Applicant Address: GB London
- Assignee: The Secretary of State for Innovation, Universities and Skills
- Current Assignee: The Secretary of State for Innovation, Universities and Skills
- Current Assignee Address: GB London
- Agency: Leason Ellis LLP
- Priority: GB0722477.7 20071115
- International Application: PCT/GB2008/003846 WO 20081117
- International Announcement: WO2009/063217 WO 20090522
- Main IPC: G01Q20/00
- IPC: G01Q20/00

Abstract:
A microprobe, measurement system and method are disclosed. The microprobe includes a probe tip mounted at a meeting point of a plurality of flexures. The probe tip is moveable upon flexing of one or more of the flexures, each flexure further comprising one or more actuators controllable to flex the flexure and one or more sensors arranged to sense flexing of the flexure.
Public/Granted literature
- US20110047661A1 MICROPROBE, MEASUREMENT SYSTEM AND METHOD Public/Granted day:2011-02-24
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