Invention Grant
- Patent Title: Imaging detector and method of manufacturing
- Patent Title (中): 成像探测器和制造方法
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Application No.: US13304248Application Date: 2011-11-23
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Publication No.: US08487265B2Publication Date: 2013-07-16
- Inventor: Floribertus P. M. Heukensfeldt Jansen , Yaron Hefetz
- Applicant: Floribertus P. M. Heukensfeldt Jansen , Yaron Hefetz
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Marie-Claire B. Maple
- Main IPC: H01L27/146
- IPC: H01L27/146

Abstract:
Imaging detectors and methods of manufacturing are provided. One imaging detector includes a first detector layer within a detector module and a second detector layer within the detector module and spaced apart from the first detector layer, wherein the second detector layer has an opening therethrough. The imaging detector also includes a collimator mounted to the detector module, wherein the collimator is one of a single pinhole collimator or a multi-pinhole collimator. Additionally, the second detector layer is mounted within the detector module closer to an opening of the collimator than the first detector layer.
Public/Granted literature
- US20130126744A1 IMAGING DETECTOR AND METHOD OF MANUFACTURING Public/Granted day:2013-05-23
Information query
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