Invention Grant
- Patent Title: X-ray detector and method for manufacturing the same
- Patent Title (中): X射线检测器及其制造方法
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Application No.: US12984515Application Date: 2011-01-04
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Publication No.: US08487266B2Publication Date: 2013-07-16
- Inventor: Hisato Yabuta , Nobuyuki Kaji , Ryo Hayashi , Masatoshi Watanabe , Taihei Mukaide , Kazunori Fukuda
- Applicant: Hisato Yabuta , Nobuyuki Kaji , Ryo Hayashi , Masatoshi Watanabe , Taihei Mukaide , Kazunori Fukuda
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A., Inc. IP Division
- Priority: JP2010-006233 20100114
- Main IPC: G01T1/24
- IPC: G01T1/24

Abstract:
An X-ray detector includes an X-ray photoelectric conversion layer configured to produce electric charges in proportion to X-ray irradiation incident on the layer, a collecting electrode configured to collect the electric charges produced by the X-ray photoelectric conversion layer, a common electrode disposed on a surface of the X-ray photoelectric conversion layer opposite to the collecting electrode, a storage capacitor configured to store the electric charges collected by the collecting electrode, and a readout unit configured to read out the electric charges stored in the storage capacitor. A voltage is to be applied between the collecting electrode and the common electrode. The X-ray photoelectric conversion layer is formed of a polycrystalline oxide.
Public/Granted literature
- US20110168905A1 X-RAY DETECTOR AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2011-07-14
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