Invention Grant
- Patent Title: Deep-ultraviolet light source capable of stopping leakage of harmful X-rays
- Patent Title (中): 能够阻止有害X射线泄漏的深紫外光源
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Application No.: US13428987Application Date: 2012-03-23
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Publication No.: US08487285B2Publication Date: 2013-07-16
- Inventor: Takahiro Matsumoto , Sho Iwayama
- Applicant: Takahiro Matsumoto , Sho Iwayama
- Applicant Address: JP Tokyo
- Assignee: Stanley Electric Co., Ltd.
- Current Assignee: Stanley Electric Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz, Goodman & Chick, PC
- Priority: JP2011-063651 20110323
- Main IPC: G21K5/02
- IPC: G21K5/02

Abstract:
In a deep-ultraviolet tight source includes sapphire substrate, a wide band gap semiconductor layer having a wavelength smaller than 300 nm, formed on the sapphire substrate, and en electron beam source for irradiating the wide band gap semiconductor layer with an electron beam. The wide band gap semiconductor layer is configured to be irradiated with the electron beam to emit deep-ultraviolet light through the sapphire substrate. A thickness t1 of the sapphire substrate satisfies: t1≧α·E3 is an energy of the electron beam (keV); and α is 1 μm/(keV)3.
Public/Granted literature
- US20120241651A1 DEEP-ULTRAVIOLET LIGHT SOURCE CAPABLE OF STOPPING LEAKAGE OF HARMFUL X-RAYS Public/Granted day:2012-09-27
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