Invention Grant
US08487293B2 Bipolar switching memory cell with built-in “on ”state rectifying current-voltage characteristics
有权
具有内置“on”状态的双极开关存储单元整流电流电压特性
- Patent Title: Bipolar switching memory cell with built-in “on ”state rectifying current-voltage characteristics
- Patent Title (中): 具有内置“on”状态的双极开关存储单元整流电流电压特性
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Application No.: US12981947Application Date: 2010-12-30
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Publication No.: US08487293B2Publication Date: 2013-07-16
- Inventor: Jun Liu , Gurtej Sandhu
- Applicant: Jun Liu , Gurtej Sandhu
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder
- Main IPC: H01L45/00
- IPC: H01L45/00 ; H01L21/02

Abstract:
A memory array is disclosed having bipolar current-voltage (IV) resistive random access memory cells with built-in “on” state rectifying IV characteristics. In one embodiment, a bipolar switching resistive random access memory cell may have a metal/solid electrolyte/semiconductor stack that forms a Schottky diode when switched to the “on” state. In another embodiment, a bipolar switching resistive random access memory cell may have a metal/solid electrolyte/tunnel barrier/electrode stack that forms a metal-insulator-metal device when switched to the “on” state. Methods of operating the memory array are also disclosed.
Public/Granted literature
- US20120168705A1 Bipolar Switching Memory Cell With Built-in "On" State Rectifying Current-Voltage Characteristics Public/Granted day:2012-07-05
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