Invention Grant
- Patent Title: Semiconductor memory device
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Application No.: US13047188Application Date: 2011-03-14
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Publication No.: US08487303B2Publication Date: 2013-07-16
- Inventor: Yasuhiko Takemura
- Applicant: Yasuhiko Takemura
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2010-063969 20100319; JP2010-077882 20100330
- Main IPC: H01L29/12
- IPC: H01L29/12

Abstract:
In a matrix including a plurality of memory cells, each in which a drain of a writing transistor is connected to a gate of a reading transistor and the drain is connected to one electrode of a capacitor, a gate of the writing transistor is connected to a writing word line, a source of the writing transistor and a source of the reading transistor is connected to a bit line, and a drain of the reading transistor is connected to a reading word line. A conductivity type of the writing transistor is different from a conductivity type of the reading transistor. In order to increase the integration degree, a bias line may be substituted with a reading word line in another row, or memory cells are connected in series so as to have a NAND structure, and a reading word line and a writing word line may be shared.
Public/Granted literature
- US20110228584A1 SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2011-09-22
Information query
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