Invention Grant
- Patent Title: Trench semiconductor device and method of manufacturing
- Patent Title (中): 沟槽半导体器件及其制造方法
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Application No.: US12847537Application Date: 2010-07-30
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Publication No.: US08487370B2Publication Date: 2013-07-16
- Inventor: Oliver Blank , Ralf Siemieniec , Martin Poelzl , Maximilian Roesch
- Applicant: Oliver Blank , Ralf Siemieniec , Martin Poelzl , Maximilian Roesch
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L29/78

Abstract:
A semiconductor device includes a semiconductor body including a trench with first and second opposing sidewalls. A first electrode is arranged in a lower portion of the trench and a second electrode in an upper portion of the trench. A dielectric structure is arranged in the trench, including a first portion between the electrodes. The first portion includes, in sequence along a lateral direction from the first sidewall to the second sidewall, a first part including a first dielectric material, a second part including a second dielectric material selectively etchable to the first dielectric material, a third part including the first dielectric material, the first dielectric material of the third part being continuously arranged along a vertical direction from a top side of the first electrode to a bottom side of the second electrode, a fourth part including the second dielectric material and a fifth part including the first dielectric material.
Public/Granted literature
- US20120025304A1 Trench Semiconductor Device and Method of Manufacturing Public/Granted day:2012-02-02
Information query
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