Invention Grant
- Patent Title: Transformer failure analysis system
- Patent Title (中): 变压器故障分析系统
-
Application No.: US13042521Application Date: 2011-03-08
-
Publication No.: US08488284B2Publication Date: 2013-07-16
- Inventor: Chien-Lung Cheng , Shyi-Ching Chern , Jim-Chwen Yeh , Yi-Hung Lan , Chen-Chang Yang
- Applicant: Chien-Lung Cheng , Shyi-Ching Chern , Jim-Chwen Yeh , Yi-Hung Lan , Chen-Chang Yang
- Applicant Address: TW Yunlin County
- Assignee: National Formosa University
- Current Assignee: National Formosa University
- Current Assignee Address: TW Yunlin County
- Agency: Bacon & Thomas, PLLC
- Priority: TW99106678A 20100308
- Main IPC: H02H7/04
- IPC: H02H7/04

Abstract:
A transformer failure analysis system using a programmable chip in conjunction with a shock response spectrum analysis method to distinguish inrush current and fault current of a transformer and to monitor the phase of an AC power source inputting to the transformer by a phase detector. When an inrush current occurs, the programmable chip provides a control signal to delay the phase of the AC power source being inputted into the transformer, thereby suppressing the occurrence of the inrush current. When a fault current occurs, the control signal cuts off the AC power source from the transformer until the operator has tested the whole circuit architecture to debug and correct circuit application and eliminated the internal fault.
Public/Granted literature
- US20110216450A1 TRANSFORMER FAILURE ANALYSIS SYSTEM Public/Granted day:2011-09-08
Information query