Invention Grant
- Patent Title: Method of computing global-to-local metrics for recognition
- Patent Title (中): 计算用于识别的全局到本地度量的方法
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Application No.: US12574717Application Date: 2009-10-07
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Publication No.: US08488873B2Publication Date: 2013-07-16
- Inventor: Mikael Rousson , Jan Erik Solem , Jerome Piovano
- Applicant: Mikael Rousson , Jan Erik Solem , Jerome Piovano
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Blakely Sokoloff, Taylor & Zafman LLP
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/00

Abstract:
A method of computing global-to-local metrics for recognition. Based on training examples with feature representations, the method automatically computes a local metric that varies over the space of feature representations to optimize discrimination and the performance of recognition systems.Given a set of points in an arbitrary features space, local metrics are learned in a hierarchical manner that give low distances between points of same class and high distances between points of different classes. Rather than considering a global metric, a class-based metric or a point-based metric, the proposed invention applies successive clustering to the data and associates a metric to each one of the clusters.
Public/Granted literature
- US20110081074A1 Method of Computing Global-to-Local Metrics for Recognition Public/Granted day:2011-04-07
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