Invention Grant
- Patent Title: Method of verifying the performance model of an integrated circuit
- Patent Title (中): 验证集成电路性能模型的方法
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Application No.: US12638865Application Date: 2009-12-15
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Publication No.: US08489377B2Publication Date: 2013-07-16
- Inventor: Reuel William Nash , Yu Bai , Xiaowei Li
- Applicant: Reuel William Nash , Yu Bai , Xiaowei Li
- Applicant Address: US CA Santa Clara
- Assignee: Nvidia Corporation
- Current Assignee: Nvidia Corporation
- Current Assignee Address: US CA Santa Clara
- Priority: CN200910131892 20090409
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method of verifying a performance model of an integrated circuit is provided. The method comprises the following steps: obtaining statistical request numbers and corresponding latency values of memory access requests; developing functions of latency value based on the statistical request numbers and the corresponding latency values; bringing a random value to one of the functions to retrieve a latency value; and verifying the logic of the performance model using the latency value retrieved in the step above.
Public/Granted literature
- US20100262415A1 METHOD OF VERIFYING THE PERFORMANCE MODEL OF AN INTEGRATED CIRCUIT Public/Granted day:2010-10-14
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