Invention Grant
US08490040B2 Disposition of integrated circuits using performance sort ring oscillator and performance path testing
有权
使用性能分类环形振荡器和性能路径测试对集成电路进行处理
- Patent Title: Disposition of integrated circuits using performance sort ring oscillator and performance path testing
- Patent Title (中): 使用性能分类环形振荡器和性能路径测试对集成电路进行处理
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Application No.: US13294220Application Date: 2011-11-11
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Publication No.: US08490040B2Publication Date: 2013-07-16
- Inventor: Jeanne P. Bickford , Peter A. Habitz , Vikram Iyengar , David E. Lackey , Jinjun Xiong
- Applicant: Jeanne P. Bickford , Peter A. Habitz , Vikram Iyengar , David E. Lackey , Jinjun Xiong
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Schmeiser, Olsen & Watts, LLP
- Agent Richard Kotulak
- Main IPC: G06F9/455
- IPC: G06F9/455 ; G06F17/50
Abstract:
A method and system for dispositioning integrated circuit chips. The method includes performing a performance path test on an integrated circuit chip having one or more clock domains, the performance path test based on applying test patterns to selected sensitizable data paths of the integrated circuit chip at different clock frequencies; and dispositioning the integrated circuit chip based on results of the performance path test.
Public/Granted literature
- US20130125076A1 DISPOSITION OF INTEGRATED CIRCUITS USING PERFORMANCE SORT RING OSCILLATOR AND PERFORMANCE PATH TESTING Public/Granted day:2013-05-16
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