Invention Grant
- Patent Title: In-situ gas analyzer probe
- Patent Title (中): 原位气体分析仪探头
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Application No.: US12683476Application Date: 2010-01-07
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Publication No.: US08490506B2Publication Date: 2013-07-23
- Inventor: Daniel Murphy
- Applicant: Daniel Murphy
- Applicant Address: US DE Wilmington
- Assignee: AA Holdings, Ltd.
- Current Assignee: AA Holdings, Ltd.
- Current Assignee Address: US DE Wilmington
- Agency: Sampson & Associates, P.C.
- Main IPC: G01D21/00
- IPC: G01D21/00

Abstract:
A probe mounted directly to a conduit conveying a process stream of gas to be analyzed, which can condition a continuous sample of the gas before it is analyzed by removing undesirable vapor components of the sample through interaction with a heat exchanger conduit which condenses these components into a liquid such that they precipitate under the force of gravity back into the process stream. The probe uses a Venturi device to motivate the gas through a flow cell chamber where it interacts with light shown through the chamber before ejecting the sample back into the process stream through a sample return conduit.
Public/Granted literature
- US20100175865A1 IN-SITU GAS ANALYZER PROBE Public/Granted day:2010-07-15
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