Invention Grant
- Patent Title: High density metal-insulator-metal trench capacitor
- Patent Title (中): 高密度金属 - 绝缘体 - 金属沟槽电容器
-
Application No.: US13021151Application Date: 2011-02-04
-
Publication No.: US08492874B2Publication Date: 2013-07-23
- Inventor: Je-Hsiung Lan , Matthew Michael Nowak , Evgeni P. Gousev , Jonghae Kim , Clarence Chui
- Applicant: Je-Hsiung Lan , Matthew Michael Nowak , Evgeni P. Gousev , Jonghae Kim , Clarence Chui
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Michelle Gallardo
- Main IPC: H01G4/10
- IPC: H01G4/10 ; H01G4/12 ; H01L23/5222 ; H01L28/82 ; H01L29/945 ; H01L23/642

Abstract:
Higher capacitance density is achieved by increasing a surface area of a capacitor. A larger surface area may be obtained by forming isotropic ball shapes (a concave surface) in the trenches on the semiconductor die. The concave surfaces are fabricated by depositing bilayers of amorphous-silicon and silicon oxide. Openings are patterned in the silicon oxide hard mask for trenches. The openings are transferred to the amorphous-silicon layers through isotropic etching to form concave surfaces. Conducting, insulating, and conducting layers are deposited on the concave surfaces of the trenches by atomic layer deposition.
Public/Granted literature
- US20120199949A1 High Density Metal-Insulator-Metal Trench Capacitor Public/Granted day:2012-08-09
Information query