Invention Grant
- Patent Title: Electronic circuit tester and method of use
- Patent Title (中): 电子电路测试仪及使用方法
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Application No.: US12752276Application Date: 2010-04-01
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Publication No.: US08493060B1Publication Date: 2013-07-23
- Inventor: Mark D. Mahoney
- Applicant: Mark D. Mahoney
- Agency: Venable, Campillo, Logan & Meaney, P.C.
- Main IPC: G01R11/32
- IPC: G01R11/32
Abstract:
An electrical circuit tester including a resistive load and a testing station for detecting the variable load. The testing station includes at least one electrical current transducer capable of detecting the variable load in an adjacent electrical power circuit. The detection of the variable load is communicated to the testing station and a variable load detection function.
Information query
