Invention Grant
- Patent Title: Programming method of non-volatile memory device
- Patent Title (中): 非易失性存储器件的编程方法
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Application No.: US13309760Application Date: 2011-12-02
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Publication No.: US08493792B2Publication Date: 2013-07-23
- Inventor: Seiichi Aritome , Soo Jin Wi
- Applicant: Seiichi Aritome , Soo Jin Wi
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2010-0122112 20101202; KR10-2011-0127830 20111201
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C11/56

Abstract:
A programming method includes setting the voltages of bit lines, performing a program operation, performing a program verify operation by supplying a program verify voltage and determining whether all of the memory cells of the selected page have been programmed with a target threshold voltage or higher, counting the number of passed memory cells corresponding to a number of pass bits, if, a result of the program verify operation, the program operation failed to program all of the memory cells of the selected page to the target threshold voltage or higher, and making a determination that determines whether the number of pass bits is greater than the first number of pass permission bits, and raising a voltage of a bit line coupled to a failed memory cell, if, as a result of the determination, the number of pass bits is greater than the first number of pass permission bits.
Public/Granted literature
- US20120140566A1 PROGRAMMING METHOD OF NON-VOLATILE MEMORY DEVICE Public/Granted day:2012-06-07
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