Invention Grant
- Patent Title: Sense-amplifier circuit of memory and calibrating method thereof
- Patent Title (中): 存储器的感应放大器电路及其校准方法
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Application No.: US13342253Application Date: 2012-01-03
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Publication No.: US08493806B1Publication Date: 2013-07-23
- Inventor: Shi-Wen Chen
- Applicant: Shi-Wen Chen
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corporation
- Current Assignee: United Microelectronics Corporation
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Agent Justin King
- Main IPC: G11C7/02
- IPC: G11C7/02

Abstract:
A sense-amplifier circuit of a memory, which includes a sense-amplifier unit, a first switch unit and a second switch unit. The sense-amplifier unit is constituted by a plurality of transistor switches and having a first, a second, a third and a fourth connection terminal. The first switch unit is configured to be parallel coupled between the first and second connection terminals of the sense-amplifier unit. The second switch unit is configured to be parallel coupled between the third and fourth connection terminals of the sense-amplifier unit. The first and second switch units each are constituted by a plurality of transistor switches coupled in parallel and are configured to control each of the parallel-coupled transistor switches on or off in the first and second switch units so as to calibrate a sensing range of the sense-amplifier unit. A calibrating method for a sense-amplifier circuit of a memory is also provided.
Public/Granted literature
- US20130170309A1 SENSE-AMPLIFIER CIRCUIT OF MEMORY AND CALIBRATING METHOD THEREOF Public/Granted day:2013-07-04
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