Invention Grant
- Patent Title: Learning-based feature detection processing device and method
- Patent Title (中): 基于学习的特征检测处理装置及方法
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Application No.: US12571946Application Date: 2009-10-01
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Publication No.: US08494258B2Publication Date: 2013-07-23
- Inventor: Jun Yokono , Yuichi Hasegawa
- Applicant: Jun Yokono , Yuichi Hasegawa
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JPP2008-258011 20081003
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/46 ; G06K9/62

Abstract:
A learning apparatus includes an image generator, a feature point extractor, a feature value calculator, and a classifier generator. The image generator generates, from an input image, images having differing scale coefficients. The feature point extractor extracts feature points from each image generated by the image generator. The feature value calculator calculates feature values for the feature points by filtering the feature points using a predetermined filter. The classifier generator generates one or more classifiers for detecting a predetermined target object from an image by means of statistical learning using the feature values.
Public/Granted literature
- US20100086176A1 Learning Apparatus and Method, Recognition Apparatus and Method, Program, and Recording Medium Public/Granted day:2010-04-08
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