Invention Grant
- Patent Title: System and method for detecting structural damage
- Patent Title (中): 检测结构损伤的系统和方法
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Application No.: US12153348Application Date: 2008-05-16
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Publication No.: US08494790B2Publication Date: 2013-07-23
- Inventor: Weidong Zhu , Guangyao Xu , Chun Nam Wong , Nengan Zheng , Benjamin Haynes Emory
- Applicant: Weidong Zhu , Guangyao Xu , Chun Nam Wong , Nengan Zheng , Benjamin Haynes Emory
- Applicant Address: US MD Baltimore
- Assignee: University of Maryland, Baltimore County
- Current Assignee: University of Maryland, Baltimore County
- Current Assignee Address: US MD Baltimore
- Agency: Nixon Peabody LLP
- Main IPC: G01N11/00
- IPC: G01N11/00

Abstract:
A system and method for detecting structural damage is provided that utilizes a general order perturbation methodology involving multiple perturbation parameters. The perturbation methodology is used iteratively in conjunction with an optimization method to identify the stiffness parameters of structures using natural frequencies and/or mode shape information. The stiffness parameters are then used to determine the location and extent of damage in a structure. A novel stochastic model is developed to model the random impact series produced manually or to generate a random impact series in a random impact device. The random impact series method or the random impact device can be used to excite a structure and generate vibration information used to obtain the stiffness parameters of the structure. The method or the device can also just be used for modal testing purposes. The random impact device is a high energy, random, and high signal-to-noise ratio system.
Public/Granted literature
- US20080294354A1 System and method for detecting structural damage Public/Granted day:2008-11-27
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