Invention Grant
- Patent Title: Structure of a magnetic-field gradient sensor and process for fabricating it in integrated technology
- Patent Title (中): 磁场梯度传感器的结构及其在综合技术中的制造工艺
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Application No.: US12990227Application Date: 2009-05-06
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Publication No.: US08494793B2Publication Date: 2013-07-23
- Inventor: Jean-Baptiste Albertini
- Applicant: Jean-Baptiste Albertini
- Applicant Address: FR Paris
- Assignee: Commissariat à l'énergie atomique et aux énergies alternatives
- Current Assignee: Commissariat à l'énergie atomique et aux énergies alternatives
- Current Assignee Address: FR Paris
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR0853051 20080507
- International Application: PCT/EP2009/055483 WO 20090506
- International Announcement: WO2009/135878 WO 20091112
- Main IPC: G01R19/00
- IPC: G01R19/00 ; G01R33/00

Abstract:
A process for measuring the gradient or an n-th order derivative, in which n is greater than 1, in a direction z, of a component Hx of a magnetic field, the component being invariant, at least locally, in a direction y. The method includes: a) positioning of N (N>n+1) elementary field sensors, each sensor being offset, relative to the neighboring sensors, along y by a distance Ty and along the z axis by a distance Δz, b) measurement of the field by each of the N sensors, and c) calculation of the desired gradient, or the desired nth-order derivative, as a function of the measurements of the field obtained during b).
Public/Granted literature
- US20110046906A1 STRUCTURE OF A MAGNETIC-FIELD GRADIENT SENSOR AND PROCESS FOR FABRICATING IT IN INTEGRATED TECHNOLOGY Public/Granted day:2011-02-24
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