Invention Grant
- Patent Title: Method for optimizing parameters for detection systems
- Patent Title (中): 检测系统参数优化方法
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Application No.: US13109258Application Date: 2011-05-17
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Publication No.: US08494808B2Publication Date: 2013-07-23
- Inventor: David A. Portnoy
- Applicant: David A. Portnoy
- Applicant Address: US MD Baltimore
- Assignee: The Johns Hopkins University
- Current Assignee: The Johns Hopkins University
- Current Assignee Address: US MD Baltimore
- Agent Noah J. Hayward
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/18

Abstract:
A method for generating scatter-plots similar to classic ROC curves to gain an understanding of the tradeoffs between probability of detection and probability of false alarm for detections systems. The method uses a stochastic optimization and an objective function to maximize probabilities of detection for probabilities of false alarm that are arbitrarily close to some target probability of false alarm.
Public/Granted literature
- US20120259584A1 Method for Optimizing Parameters for Detection Systems Public/Granted day:2012-10-11
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